URL: https://ieeexplore.ieee.org/document/9774557/
Authors: Wessman, Nils-Johan / Malatesta, Fabio / Ribes, Stefano / Andersson, Jan / Garcia-Vilanova, Antonio / Masmano, Miguel / Nicolau, Vicente / Gomez, Paco / Le Rhun, Jimmy / Alcaide, Sergi / Cabo, Guillem / Bas, Francisco / Benedicte, Pedro / Mazzocchetti, Fabio / Abella, Jaume
Publication: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Place Published: Antwerp, Belgium
Volume / Pagination: 7322 / 802 - 807
Paraules clau: De-RISC, MPSoC, RISC-V, Safety Critical Systems, space processor