Error Analysis and Retention-Aware Error Management for NAND Flash Memory

Journal 2013

Authors: Cai, Yu / Yalcin, Gulay / Mutlu, Onur / Haratsch, Eric / Cristal, Adrián / Unsal, Osman / Mai, Ken

Publication: Intel Technology Journal

Volume / Number / Pagination: 17 / 1 / 140–164