URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6132973
Authors: Alonso, Javier / Goiri, Íñigo / Guitart, Jordi / Gavaldà, Ricard / Torres, Jordi
Publication: 22th IEEE International Symposium on Software Reliability Engineering (ISSRE'11)
Place Published: Hiroshima, Japan
Pagination: 250-259