URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7310933
Authors: Abadal, Sergi / Sheinman, Benny / Katz, Oded / Markish, Ofer / Elad, Danny / Fournier, Yvan / Roca, Damian / Hanzich, Mauricio / Houzeaux, G. / Nemirovsky, Mario / ,
Publication: IEEE Micro
Volume / Number / Pagination: 35 / 5 / 52–61