WCET Analysis Methods: Pitfalls and Challenges on their Trustworthiness

International Conferences 2015

URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7185039&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D7185039

Authors: Abella, Jaume / Hernández, Carles / Quinones, Eduardo / Cazorla, Francisco / Conmy, Philippa / Azkarate-askasua, Mikel / Perez, Jon / Mezzetti, Enrico / Vardanega, Tullio

Publication: 10th IEEE International Symposium on Industrial Embedded Systems (SIES)

Pagination: 1-10