WCET Analysis Methods: Pitfalls and Challenges on their Trustworthiness
Authors: Abella, Jaume / Hernández, Carles / Quinones, Eduardo / Cazorla, Francisco / Conmy, Philippa / Azkarate-askasua, Mikel / Perez, Jon / Mezzetti, Enrico / Vardanega, Tullio
Publication: 10th IEEE International Symposium on Industrial Embedded Systems (SIES)
Pagination: 1-10