A Vulnerability Factor for ECC-protected Memory

International Conferences 2019

URL: https://ieeexplore.ieee.org/document/8854397/

Authors: Jaulmes, Luc / Moreto, Miquel / Valero, Mateo / Casas, Marc

Publication: 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)

Pagination: 176 - 181