Characterizing Fault Propagation in Safety-Critical Processor Designs

International Conferences 2015

URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7229848&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D7229848

Authors: Espinosa, Jaime / Hernández, Carles / Abella, Jaume

Publication: 21st IEEE International On-Line Testing Symposium (IOLTS), Elia, Halkidiki, Greece

Pagination: 144-149