URL: https://ieeexplore.ieee.org/document/10109300/
Authors: Brando, Axel / Serra, Isabel / Mezzetti, Enrico / Cazorla, Francisco / Perez-Cerrolaza, Jon / Abella, Jaume
Research Lines: Deep-Learning and HPC
Publication: Computer
Place Published: Institute of Electrical and Electronics Engineers (IEEE)
Volume / Pagination: 5633 / 41 - 50
Palabras clave: deep learning, redundancy, Neural networks, Safety, Embedded systems, Contingency management