Empirical Analysis of the Specialization of a Diversity Metric per Circuit Path (to appear)
URL: https://selse.org/previous-workshops/2021-archive/2021-program/
Authors: Alcaide, Sergi / Carles, Hernandez / Abella, Jaume
Publication: SELSE 2021 17th Workshop on Silicon Errors in Logic - System Effects
Place Published: SELSE 2021 17th Workshop on Silicon Errors in Logic - System Effects
Paraules clau: SELENE, diversity, fault tolerance, functional safety