Published on BSC-CNS (https://www.bsc.es)

Inici > FaulTM: Error Detection and Recovery Using Hardware Transactional Memory

FaulTM: Error Detection and Recovery Using Hardware Transactional Memory

Authors: Yalcin, Gulay / Unsal, Osman / Cristal, Adrián

Publication: ACM/IEEE Design, Automation, and Test in Europe (DATE)

Place Published: Grenoble, France

Barcelona Supercomputing Center - Centro Nacional de Supercomputación
Source URL (retrieved on 25 nov 2024 - 08:11): https://www.bsc.es/ca/node/40582